Files
android_kernel_xiaomi_sm8450/drivers/acpi
Dan Williams f110176633 tools/testing/nvdimm: Populate dirty shutdown data
Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.

Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2018-10-17 10:47:19 -07:00
..
2016-04-27 23:42:57 +02:00
2016-01-04 22:10:30 +01:00
2015-07-08 02:27:32 +02:00
2015-07-08 02:27:32 +02:00
2018-01-09 16:34:34 +01:00
2015-07-08 02:27:32 +02:00
2018-05-17 17:28:09 +01:00
2018-06-06 16:10:10 -05:00
2018-05-02 13:01:08 +02:00
2018-02-21 23:27:13 +01:00
2018-06-12 16:19:22 -07:00