tools/testing/nvdimm: Populate dirty shutdown data

Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.

Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>
This commit is contained in:
Dan Williams
2018-10-17 10:47:19 -07:00
parent 0ead11181f
commit f110176633
4 changed files with 16 additions and 3 deletions

View File

@@ -22,6 +22,7 @@ NVDIMM_SRC := $(DRIVERS)/nvdimm
ACPI_SRC := $(DRIVERS)/acpi/nfit
DAX_SRC := $(DRIVERS)/dax
ccflags-y := -I$(src)/$(NVDIMM_SRC)/
ccflags-y += -I$(src)/$(ACPI_SRC)/
obj-$(CONFIG_LIBNVDIMM) += libnvdimm.o
obj-$(CONFIG_BLK_DEV_PMEM) += nd_pmem.o

View File

@@ -4,5 +4,13 @@
#include <linux/module.h>
#include <linux/printk.h>
#include "watermark.h"
#include <nfit.h>
nfit_test_watermark(acpi_nfit);
/* strong / override definition of nfit_intel_shutdown_status */
void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
{
set_bit(NFIT_MEM_DIRTY_COUNT, &nfit_mem->flags);
nfit_mem->dirty_shutdown = 42;
}

View File

@@ -149,6 +149,7 @@ static const struct nd_intel_smart smart_def = {
| ND_INTEL_SMART_ALARM_VALID
| ND_INTEL_SMART_USED_VALID
| ND_INTEL_SMART_SHUTDOWN_VALID
| ND_INTEL_SMART_SHUTDOWN_COUNT_VALID
| ND_INTEL_SMART_MTEMP_VALID
| ND_INTEL_SMART_CTEMP_VALID,
.health = ND_INTEL_SMART_NON_CRITICAL_HEALTH,
@@ -161,8 +162,8 @@ static const struct nd_intel_smart smart_def = {
.ait_status = 1,
.life_used = 5,
.shutdown_state = 0,
.shutdown_count = 42,
.vendor_size = 0,
.shutdown_count = 100,
};
struct nfit_test_fw {