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sfc: Disable VF queues during register self-test

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Currently VF queues and drivers may remain active during this test.
This could cause memory corruption or spurious test failures.
Therefore we reset the port/function before running these tests on
Siena.

On Falcon this doesn't work: we have to do some additional
initialisation before some blocks will work again.  So refactor the
reset/register-test sequence into an efx_nic_type method so
efx_selftest() doesn't have to consider such quirks.

In the process, fix another minor bug: Siena does not have an
'invisible' reset and the self-test currently fails to push the PHY
configuration after resetting.  Passing RESET_TYPE_ALL to
efx_reset_{down,up}() fixes this.

Signed-off-by: Ben Hutchings <bhutchings@solarflare.com>
This commit is contained in:
Ben Hutchings
2012-07-04 03:58:33 +01:00
parent 0f1e54ae52
commit d4f2cecce1
5 changed files with 76 additions and 60 deletions
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62
drivers/net/ethernet/sfc/selftest.c
View File

@@ -120,19 +120,6 @@ static int efx_test_nvram(struct efx_nic *efx, struct efx_self_tests *tests)
return rc;
}
static int efx_test_chip(struct efx_nic *efx, struct efx_self_tests *tests)
{
int rc = 0;
/* Test register access */
if (efx->type->test_registers) {
rc = efx->type->test_registers(efx);
tests->registers = rc ? -1 : 1;
}
return rc;
}
/**************************************************************************
*
* Interrupt and event queue testing
@@ -699,8 +686,7 @@ int efx_selftest(struct efx_nic *efx, struct efx_self_tests *tests,
{
enum efx_loopback_mode loopback_mode = efx->loopback_mode;
int phy_mode = efx->phy_mode;
enum reset_type reset_method = RESET_TYPE_INVISIBLE;
int rc_test = 0, rc_reset = 0, rc;
int rc_test = 0, rc_reset, rc;
efx_selftest_async_cancel(efx);
@@ -737,44 +723,26 @@ int efx_selftest(struct efx_nic *efx, struct efx_self_tests *tests,
*/
netif_device_detach(efx->net_dev);
mutex_lock(&efx->mac_lock);
if (efx->loopback_modes) {
/* We need the 312 clock from the PHY to test the XMAC
* registers, so move into XGMII loopback if available */
if (efx->loopback_modes & (1 << LOOPBACK_XGMII))
efx->loopback_mode = LOOPBACK_XGMII;
else
efx->loopback_mode = __ffs(efx->loopback_modes);
if (efx->type->test_chip) {
rc_reset = efx->type->test_chip(efx, tests);
if (rc_reset) {
netif_err(efx, hw, efx->net_dev,
"Unable to recover from chip test\n");
efx_schedule_reset(efx, RESET_TYPE_DISABLE);
return rc_reset;
}
if ((tests->registers < 0) && !rc_test)
rc_test = -EIO;
}
__efx_reconfigure_port(efx);
mutex_unlock(&efx->mac_lock);
/* free up all consumers of SRAM (including all the queues) */
efx_reset_down(efx, reset_method);
rc = efx_test_chip(efx, tests);
if (rc && !rc_test)
rc_test = rc;
/* reset the chip to recover from the register test */
rc_reset = efx->type->reset(efx, reset_method);
/* Ensure that the phy is powered and out of loopback
* for the bist and loopback tests */
mutex_lock(&efx->mac_lock);
efx->phy_mode &= ~PHY_MODE_LOW_POWER;
efx->loopback_mode = LOOPBACK_NONE;
rc = efx_reset_up(efx, reset_method, rc_reset == 0);
if (rc && !rc_reset)
rc_reset = rc;
if (rc_reset) {
netif_err(efx, drv, efx->net_dev,
"Unable to recover from chip test\n");
efx_schedule_reset(efx, RESET_TYPE_DISABLE);
return rc_reset;
}
__efx_reconfigure_port(efx);
mutex_unlock(&efx->mac_lock);
rc = efx_test_phy(efx, tests, flags);
if (rc && !rc_test)