of: Add unit tests for applying overlays

Existing overlay unit tests examine individual pieces of the overlay
code.  The new tests target the entire process of applying an overlay.

Signed-off-by: Frank Rowand <frank.rowand@sony.com>
Signed-off-by: Rob Herring <robh@kernel.org>
This commit is contained in:
Frank Rowand
2017-04-25 17:09:54 -07:00
committato da Rob Herring
parent 331f741679
commit 81d0848fc8
7 ha cambiato i file con 505 aggiunte e 8 eliminazioni

Vedi File

@@ -31,6 +31,8 @@
#include <asm/setup.h> /* for COMMAND_LINE_SIZE */
#include <asm/page.h>
#include "of_private.h"
/*
* of_fdt_limit_memory - limit the number of regions in the /memory node
* @limit: maximum entries
@@ -469,11 +471,11 @@ static int unflatten_dt_nodes(const void *blob,
* Returns NULL on failure or the memory chunk containing the unflattened
* device tree on success.
*/
static void *__unflatten_device_tree(const void *blob,
struct device_node *dad,
struct device_node **mynodes,
void *(*dt_alloc)(u64 size, u64 align),
bool detached)
void *__unflatten_device_tree(const void *blob,
struct device_node *dad,
struct device_node **mynodes,
void *(*dt_alloc)(u64 size, u64 align),
bool detached)
{
int size;
void *mem;
@@ -1261,6 +1263,8 @@ void __init unflatten_device_tree(void)
/* Get pointer to "/chosen" and "/aliases" nodes for use everywhere */
of_alias_scan(early_init_dt_alloc_memory_arch);
unittest_unflatten_overlay_base();
}
/**