of: Add unit tests for applying overlays
Existing overlay unit tests examine individual pieces of the overlay code. The new tests target the entire process of applying an overlay. Signed-off-by: Frank Rowand <frank.rowand@sony.com> Signed-off-by: Rob Herring <robh@kernel.org>
This commit is contained in:

committato da
Rob Herring

parent
331f741679
commit
81d0848fc8
@@ -31,6 +31,8 @@
|
||||
#include <asm/setup.h> /* for COMMAND_LINE_SIZE */
|
||||
#include <asm/page.h>
|
||||
|
||||
#include "of_private.h"
|
||||
|
||||
/*
|
||||
* of_fdt_limit_memory - limit the number of regions in the /memory node
|
||||
* @limit: maximum entries
|
||||
@@ -469,11 +471,11 @@ static int unflatten_dt_nodes(const void *blob,
|
||||
* Returns NULL on failure or the memory chunk containing the unflattened
|
||||
* device tree on success.
|
||||
*/
|
||||
static void *__unflatten_device_tree(const void *blob,
|
||||
struct device_node *dad,
|
||||
struct device_node **mynodes,
|
||||
void *(*dt_alloc)(u64 size, u64 align),
|
||||
bool detached)
|
||||
void *__unflatten_device_tree(const void *blob,
|
||||
struct device_node *dad,
|
||||
struct device_node **mynodes,
|
||||
void *(*dt_alloc)(u64 size, u64 align),
|
||||
bool detached)
|
||||
{
|
||||
int size;
|
||||
void *mem;
|
||||
@@ -1261,6 +1263,8 @@ void __init unflatten_device_tree(void)
|
||||
|
||||
/* Get pointer to "/chosen" and "/aliases" nodes for use everywhere */
|
||||
of_alias_scan(early_init_dt_alloc_memory_arch);
|
||||
|
||||
unittest_unflatten_overlay_base();
|
||||
}
|
||||
|
||||
/**
|
||||
|
Fai riferimento in un nuovo problema
Block a user