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mtd: rawnand: Use nanddev_mtd_max_bad_blocks()

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nanddev_mtd_max_bad_blocks() is implemented by the generic NAND layer
and is already doing what we need. Reuse this function instead of
having our own implementation.

While at it, get rid of the ->max_bb_per_die and ->blocks_per_die
fields which are now unused.

Signed-off-by: Boris Brezillon <bbrezillon@kernel.org>
Signed-off-by: Miquel Raynal <miquel.raynal@bootlin.com>
Reviewed-by: Frieder Schrempf <frieder.schrempf@kontron.de>
This commit is contained in:
Boris Brezillon
2018-11-04 14:50:28 +01:00
committed by Miquel Raynal
parent d974541e23
commit 7beb37e5f0
3 changed files with 1 additions and 45 deletions
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5
include/linux/mtd/rawnand.h
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@@ -1015,9 +1015,6 @@ struct nand_legacy {
* @id: [INTERN] holds NAND ID
* @parameters: [INTERN] holds generic parameters under an easily
* readable form.
* @max_bb_per_die: [INTERN] the max number of bad blocks each die of a
* this nand device will encounter their life times.
* @blocks_per_die: [INTERN] The number of PEBs in a die
* @data_interface: [INTERN] NAND interface timing information
* @cur_cs: currently selected target. -1 means no target selected,
* otherwise we should always have cur_cs >= 0 &&
@@ -1076,8 +1073,6 @@ struct nand_chip {
struct nand_id id;
struct nand_parameters parameters;
u16 max_bb_per_die;
u32 blocks_per_die;
struct nand_data_interface data_interface;