iio: adc: ti_am335x_tscadc: Improve accuracy of measurement

When performing single ended measurements with TSCADC, its recommended
to set negative input (SEL_INM_SWC_3_0) of ADC step to ADC's VREFN in the
corresponding STEP_CONFIGx register.

Also, the positive(SEL_RFP_SWC_2_0) and negative(SEL_RFM_SWC_1_0)
reference voltage for ADC step needs to be set to VREFP and VREFN
respectively in STEP_CONFIGx register.
Without these changes, there may be variation of as much as ~2% in the
ADC's digital output which is bad for precise measurement.

Signed-off-by: Vignesh R <vigneshr@ti.com>
Acked-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Signed-off-by: Lee Jones <lee.jones@linaro.org>

drivers/iio/adc/ti_am335x_adc.c

@@ -142,7 +142,10 @@ static void tiadc_step_config(struct iio_dev *indio_dev)
 			stepconfig |= STEPCONFIG_MODE_SWCNT;
 
 		tiadc_writel(adc_dev, REG_STEPCONFIG(steps),
-				stepconfig | STEPCONFIG_INP(chan));
+				stepconfig | STEPCONFIG_INP(chan) |
+				STEPCONFIG_INM_ADCREFM |
+				STEPCONFIG_RFP_VREFP |
+				STEPCONFIG_RFM_VREFN);
 
 		if (adc_dev->open_delay[i] > STEPDELAY_OPEN_MASK) {
 			dev_warn(dev, "chan %d open delay truncating to 0x3FFFF\n",