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Merge tag 'libnvdimm-fixes-4.20-rc3' of git://git.kernel.org/pub/scm/linux/kernel/git/nvdimm/nvdimm

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Pull libnvdimm fixes from Dan Williams:
 "A small batch of fixes for v4.20-rc3.

  The overflow continuation fix addresses something that has been broken
  for several releases. Arguably it could wait even longer, but it's a
  one line fix and this finishes the last of the known address range
  scrub bug reports. The revert addresses a lockdep regression. The unit
  tests are not critical to fix, but no reason to hold this fix back.

  Summary:

   - Address Range Scrub overflow continuation handling has been broken
     since it was initially merged. It was only recently that error
     injection and platform-BIOS support enabled this corner case to be
     exercised.

   - The recent attempt to provide more isolation for the kernel Address
     Range Scrub state machine from userapace initiated sessions
     triggers a lockdep report. Revert and try again at the next merge
     window.

   - Fix a kasan reported buffer overflow in libnvdimm unit test
     infrastrucutre (nfit_test)"

* tag 'libnvdimm-fixes-4.20-rc3' of git://git.kernel.org/pub/scm/linux/kernel/git/nvdimm/nvdimm:
  Revert "acpi, nfit: Further restrict userspace ARS start requests"
  acpi, nfit: Fix ARS overflow continuation
  tools/testing/nvdimm: Fix the array size for dimm devices.
This commit is contained in:
Linus Torvalds
2018-11-18 12:21:09 -08:00
parent c67a98c00e 2121db0963
commit 25e19c1fe4
2 changed files with 9 additions and 18 deletions
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8
tools/testing/nvdimm/test/nfit.c
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@@ -140,8 +140,8 @@ static u32 handle[] = {
[6] = NFIT_DIMM_HANDLE(1, 0, 0, 0, 1),
};
static unsigned long dimm_fail_cmd_flags[NUM_DCR];
static int dimm_fail_cmd_code[NUM_DCR];
static unsigned long dimm_fail_cmd_flags[ARRAY_SIZE(handle)];
static int dimm_fail_cmd_code[ARRAY_SIZE(handle)];
static const struct nd_intel_smart smart_def = {
.flags = ND_INTEL_SMART_HEALTH_VALID
@@ -205,7 +205,7 @@ struct nfit_test {
unsigned long deadline;
spinlock_t lock;
} ars_state;
struct device *dimm_dev[NUM_DCR];
struct device *dimm_dev[ARRAY_SIZE(handle)];
struct nd_intel_smart *smart;
struct nd_intel_smart_threshold *smart_threshold;
struct badrange badrange;
@@ -2680,7 +2680,7 @@ static int nfit_test_probe(struct platform_device *pdev)
u32 nfit_handle = __to_nfit_memdev(nfit_mem)->device_handle;
int i;
for (i = 0; i < NUM_DCR; i++)
for (i = 0; i < ARRAY_SIZE(handle); i++)
if (nfit_handle == handle[i])
dev_set_drvdata(nfit_test->dimm_dev[i],
nfit_mem);