acpi, nfit: Collect shutdown status

Some NVDIMMs, in addition to providing an indication of whether the
previous shutdown was clean, also provide a running count of lifetime
dirty-shutdown events for the device. In anticipation of this
functionality appearing on more devices arrange for the nfit driver to
retrieve / cache this data at DIMM discovery time, and export it via
sysfs.

Reviewed-by: Keith Busch <keith.busch@intel.com>
Signed-off-by: Dan Williams <dan.j.williams@intel.com>

tools/testing/nvdimm/test/nfit.c

@@ -24,6 +24,7 @@
 #include <linux/list.h>
 #include <linux/slab.h>
 #include <nd-core.h>
+#include <intel.h>
 #include <nfit.h>
 #include <nd.h>
 #include "nfit_test.h"

tools/testing/nvdimm/test/nfit_test.h

@@ -117,30 +117,6 @@ struct nd_cmd_ars_err_inj_stat {
 #define ND_INTEL_SMART_INJECT_FATAL		(1 << 2)
 #define ND_INTEL_SMART_INJECT_SHUTDOWN		(1 << 3)
 
-struct nd_intel_smart {
-	__u32 status;
-	union {
-		struct {
-			__u32 flags;
-			__u8 reserved0[4];
-			__u8 health;
-			__u8 spares;
-			__u8 life_used;
-			__u8 alarm_flags;
-			__u16 media_temperature;
-			__u16 ctrl_temperature;
-			__u32 shutdown_count;
-			__u8 ait_status;
-			__u16 pmic_temperature;
-			__u8 reserved1[8];
-			__u8 shutdown_state;
-			__u32 vendor_size;
-			__u8 vendor_data[92];
-		} __packed;
-		__u8 data[128];
-	};
-} __packed;
-
 struct nd_intel_smart_threshold {
 	__u32 status;
 	union {