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disp: msm: fix debug bus test point selection

Sfoglia il codice sorgente 
Extension bits of test point selection is needed when test
point value exceeds three bits, not based on blcok id value.
This change fixes debug bus test point selection when
value is more than 3 bits and extension bits are required.

Change-Id: I37688b2c6e476b1271daad0bbddb5896edc530d1
Signed-off-by: Prabhanjan Kandula <quic_pkandula@quicinc.com>
This commit is contained in:
Prabhanjan Kandula
2023-06-08 12:01:05 -07:00
committato da Gerrit - the friendly Code Review server
parent 34cfc1c19a
commit 7d8dbc2fb3
1 ha cambiato i file con 1 aggiunte e 1 eliminazioni
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2
msm/sde_dbg.c
Vedi File

@@ -934,7 +934,7 @@ static void _sde_dbg_vbif_clear_test_point(void __iomem *mem_base, u32 wr_addr)
static u32 _sde_dbg_sde_read_test_point(void __iomem *mem_base, u32 wr_addr, u32 rd_addr, static u32 _sde_dbg_sde_read_test_point(void __iomem *mem_base, u32 wr_addr, u32 rd_addr,
u32 block_id, u32 test_id) u32 block_id, u32 test_id)
{ {
if (block_id > EXT_TEST_GROUP_SEL_EN) if (test_id > EXT_TEST_GROUP_SEL_EN)
writel_relaxed(TEST_EXT_MASK(block_id, test_id), mem_base + wr_addr); writel_relaxed(TEST_EXT_MASK(block_id, test_id), mem_base + wr_addr);
else else
writel_relaxed(TEST_MASK(block_id, test_id), mem_base + wr_addr); writel_relaxed(TEST_MASK(block_id, test_id), mem_base + wr_addr);